Berrin Yanıkoğlu
Machine Learning, Deep Learning, Computer Vision, Biometrics.
Faculty of Engineering and Natural Sciences, Sabanci University,
Istanbul, Turkiye
| Education |
| Galatasaray Highschool (1983). B.E. in Computer Engineering and B.A. in Mathematics, Bosphorous University, 1988. M.S. and PhD from Dartmouth College, USA (1993). |
| Work Experience |
| Rockefeller University (USA), 1993-1994; Xerox Imaging Systems (USA), 1994-1996; IBM Almaden Research Center (USA), 1996-1998; IoFlex Inc. (USA), 1999-2000. |
| Areas of Interest |
| Computer vision & Machine learning: biometrics, document recognition, image understanding |
| Memberships |
| IEEE |
| Awards |
| 2nd place in 2016 PlantCLEF Plant Identification Campaign – CLEF Conference 2016 Winner of ImageCLEF Plant Identification Competition – 2012 Top Cited Article Award – Pattern Recognition Letters, Elsevier 2010 First International Signature Verification Competition (SVC 2004) Winner – 2004 IBM Research Division Award – IBM 1998 |